The controllers can be configured with a WES7 OS, which gives engineers access to a broad ecosystem of Windows-based software and integrated graphics, or a real-time OS for reliable, deterministic performance.
The systems provide a variety of high-performance peripheral connectivity including two Gigabit Ethernet ports, a MXI Express port, four USB ports, RS232 and RS485 serial ports and a new CPU eXpansion Module (CXM) that makes it possible to add custom connectivity and expansion to CompactRIO using industry standard protocols.
The new NI Single-Board RIO devices provide a small and cost-optimized form factor for the NI RIO platform and are ideal for embedded monitoring and control applications in industries such as energy and medical. The devices feature a 400 MHz processor and Xilinx Spartan-6 FPGA to provide reliability and performance at a low price point for OEMs.
The devices also offer built-in peripherals such as RS232, CAN, USB and Ethernet. Additionally, the new devices feature a high-density and high-bandwidth connecter that gives engineers direct access to the FPGA and processor as well as the ability to add peripherals for further customization.
“NREL is working directly with National Instruments to develop advanced power electronics inverter control hardware based on reconfigurable FPGA technology for renewable, electric vehicle and smart grid systems,” says Dr. Bill Kramer, who manages research and development for Energy Systems Integration Technologies at The National Renewable Energy Laboratory.
He added that with the new high bandwidth connector on these NI Single-Board RIO devices and LabVIEW programming tools, we now can take our simulations and advanced algorithms from prototype to high-volume, deployable targets more quickly than ever.
An integral part of the NI graphical system design approach, NI RIO technology combines NI LabVIEW system design software with commercial off-the-shelf hardware to simplify development and shorten time to market when designing advanced control, monitoring and test systems.