E-Beam Wafer Inspection Systems Market to Reach $1.4 Billion


The global market for E-Beam Wafer Inspection Systems was estimated at US$459.9 Million in the year 2020

Global Industry Analysts noted that the global E-beam inspection systems market will reach $1.4 billion by the year 2026. Since e-beam wafer inspection technology is designed to operate in the 2 nm range, the technology is ideal for inspecting semiconductor wafers.

“Driven by increasing efforts to maximize throughput times, for instance through engagement of multiple beams, the market for e-beam wafer inspection systems holds significant potential for growth. Because of the rapid and sustained advancement being experienced by the semiconductors and electronics industry, defects management is more critical in the present day environment,” read the report.

The global market for E-Beam Wafer Inspection Systems was estimated at US$459.9 Million in the year 2020. More than 10 nm, one of the segments analyzed in the report, is projected to grow at a 19.5 per cent CAGR to reach US$1.1 Billion by the end of the analysis period. After a thorough analysis of the business implications of the pandemic and its induced economic crisis, growth in the 1 To 10 Nm segment is readjusted to a revised 20.2 per cent CAGR for the next 7-year period.

This segment currently accounts for a 22.3 per cent share of the global E-Beam Wafer Inspection Systems market. E-Beam Wafer Inspection, with Resolving Power of more than 10nm, extends an inspection system with the flexibility, sensitivity, and production-worthy performance required for inline monitoring of product wafers at >10nm node.

E-Beam Wafer Inspection, with Resolving Power in the range of one to 10nm, offers superior reliability in scaling the transistor to 10nm. Migrating to 10nm nodes entails numerous challenges, with killer defects being the primary concern. Detecting wafer defects is becoming complicated and expensive at each node, and remains extremely challenging at 10nm, where E-Beam Wafer Inspection extends a reliable model to ensure flawless detection of defects.

Less Than 1 nm Segment to Reach $100 Million by 2026

E-beam hotspot inspection tools with resolving power of less than 1nm enable detection of the most challenging defects that other technologies fail to notice. E-beam inspection systems with 1nm resolution support are extremely useful in R&D, ramp and production control of multiple patterning, 3D NAND, DRAM, and FinFET formation applications.

In the global Less Than 1 nm segment, USA, Canada, Japan, China and Europe will drive the 22 per cent CAGR estimated for this segment. These regional markets accounting for a combined market size of US$14.9 Million in the year 2020 will reach a projected size of US$60 Million by the close of the analysis period. China will remain among the fastest growing in this cluster of regional markets. Led by countries such as Australia, India, and South Korea, the market in Asia-Pacific is forecast to reach US$38.6 Million by the year 2026.


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